Summary

Test Engineering, Semiconductor Test, ATE, LabVIEW, NI, Credence, Advantest, Verigy, Agilent, Teradyne, Cohu, LTX, CASS, eCASS, Test, Reliability, Qualification, Automated Test, Failure Analysis, Characterization, Circuit Board Design, PCB, Test Sockets, HTOL, HAST

Description

Test pattern conversion, test interface development, test program development, device characterization, failure analysis, test program optimization, sample production, and test program conversion to reduce production costs.

Profile

  • Incorporated in
    Wyoming
  • Established since
    2006
  • Main/Branch
    Branch

Address

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