Summary

Microscopy, scanning electron microscope, SEM, sample preparation, cross sectioning, ion polishing, materials, analysis, energy dispersive x-ray spectroscopy, EDS, EDX, gold sputtering, carbon sputtering, failure analysis, surface analysis, metrology, rapid, expedited

Description

Scanning electron microscope (SEM) imaging capable of resolving and measuring features down to 3nm in high vacuum, 4nm in low vacuum. We can accommodate samples up to 2 inches cubed, both conductive and non-conductive, and up to 2lb in weight. Images can be obtained from multiple viewing angles, including normal to the surface and off-axis to capture detailed surface topography. Energy dispersive x-ray spectroscopy (EDS) identifies the elemental makeup of the features in the microscope's field of view. The silicon drift detector EDS system provides spectra and area maps showing elemental identification, composition, distribution, and line profiles. Our sample preparation services include sample size reduction, diamond wire saw cross-sectioning, ion beam cross-section polishing, and gold sputter coating on non-conducting samples to improve image contrast and quality. Specialized mounting requirements can be met in-house.

Special details

Scanning electron microscope (SEM) Energy dispersive x-ray spectroscopy (EDS/EDX) Sputter coating (gold/carbon) Ion beam cross-section polishing Diamond wire saw On-site machine shop (for custom sample mounting) Long working distance microscope with CCD camera

Profile

  • Incorporated in
    New Mexico
  • Established since
    2023
  • Main/Branch
    Branch

Address

Contact