Summary

microscope, electron, scanning electron microscope, SEM, FIB, Focused ion beam, aperture, LMIS, extractor, suppressor, CDEM, plasma, services, analytical, research and development, camscan, parts, consumables, detector

Description

Applied Beams was founded to serve the needs of advanced device manufacturers and materials researchers. We apply our expertise as customer oriented professionals to deliver high performance products for your SEM, FIB and FIB-SEM systems at affordable price levels. We understand your need for a complete solution – from delivery to installation to service and applications support – and we’re pleased to be your complete systems provider. We provide research, development, direct replacement consumables and high performance electron and ion beam systems which go beyond traditional capabilities found in today’s focused beam instruments.

Special details

Focused Ion Beam Microscopes Plasma FIB Scanning Electron Microscopes Atomic Force Microscope

Profile

  • Incorporated in
    Oregon
  • Established since
    2009
  • Main/Branch
    Branch

Address

Contact