Summary

detector, VIS/NIR, UV, X-ray, hybrid focal plane, backside thinned detector, tiled detector, photon, photonic, photodiode, protein crystallography, scattering detector, contrast imaging, ptychography. imaging detector, non destructive testing, NDT, CMOS, Metal Oxide Semiconductor, semiconductor, energy imaging detector photonics, x-ray imaging, Selenium, non destructive assay

Description

Research and development, engineering design, early technology development, prototype, and commercialization of solid state image sensor devices, imaging systems, advanced detector technologies, and hybrid focal plane technologies for use in Medical, Scientific, Aerospace and Industrial inspection applications. Experience with high quality digital X-ray imaging sensors, dual energy detectors, silicon based detectors, IR, VIS, UV, X-ray, CMOS/CCD process technologies, space-based camera detector systems, Medical and Scientific X-ray panel development. Developed X-ray detector technology for advanced materials research at nanoscale resolution for use in microCT, X-Ray diffraction, and various X-ray imaging scientific and industrial applications. Foundry Interface, IP Development, Business Development, Start-up Mentoring, Expert Witness, Patent application expertise. Holds 14 US patents

Special details

Tanner Tools EDA, X-ray test bench

Profile

  • Incorporated in
    Michigan
  • Established since
    2002
  • Main/Branch
    Branch

Address

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