Summary

semiconductor, metrology, inspection, process control, lithography, factory analytics

Industry

Description

Onto Innovation is a leader in process control, combining global scale with an expanded portfolio of leading edge technologies that include: 3D metrology spanning the chip from nanometer-scale transistors to micron level die-interconnects; macro defect inspection of wafers and packages; metal interconnect composition; factory analytics; and lithography for advanced semiconductor packaging

Profile

  • Incorporated in
    Delaware
  • Established since
    1975
  • Main/Branch
    Branch

Address