Summary

mercury probe, C-V plotter, resistivity profile, doping profile, oxide charge, permittivity, dielectric constant, oxide integrity, lifetime, Dit, surface charge, hot chuck, cryogenic prober, I-V plotter, leakage current, DLCP

Industry

Description

Development of instrumentation and software for capacitance-voltage and current-voltage analysis of semiconductor and nanometer devices.

Special details

Capacitance-Voltage Plotters, Doping/Resistivity Profilers, Mercury Probes, Hot Chuck Systems

Profile

  • Incorporated in
    California
  • Established since
    1970
  • Main/Branch
    Branch

Address

Contact