Summary

Thickness measurement, thin film, ellipsometry, layer measurement, optical measurement, optical constants, spectroscopic reflectance, light sources

Description

Semiconsoft, inc. designs and manufactures thin- film measurement system based on spectroscopic reflectance. Practically any translucent films in 1nm -1mm thickness range can be measured.

Profile

  • Incorporated in
    Delaware
  • Established since
    2001
  • Main/Branch
    Branch

Address