Summary

ATMOSPHERE TEST, BAROMETRIC TESTING, BURN-IN, DPA, ELECTRICAL TESTING, ELECTRONIC TEST LAB, FAILURE ANALYSIS, HAST TEST, SHOCK TESTING, HYBRID, MICROELECTRONICS, PACKAGING OF ICS, OPTOELECTRONICS, SEMICONDUCTORS, SCREENING, TRANSISTOR TESTING, VIBRATION, X-RAY

Description

military,aerospace,defense and commercial semiconductor testing, electronic component processing and packaging,destructive physical analysis and failure analysis services

Special details

Clean Room-Class 10,000, X-Ray, Vibration/Shock, Test and Measurement equipment for most electronic components for all MIL SPEC tests. DPA Failure Analsis

Profile

  • Incorporated in
    California
  • Established since
    1980
  • Main/Branch
    Branch

Address

Contact